GB/T 17626 consists of the following parts, under the general title Electromagetic Compatibility — Testing and Measurement Techniques:
— GB/T 17626.1-2006 Electromagnetic Compatibility — Testing and Measurement Techniques — Overview of Immunity Tests;
— GB/T 17626.2-2018 Electromagnetic Compatibility — Testing and Measurement Techniques — Electrostatic Discharge Immunity Test;
— GB/T 17626.3-2016 Electromagnetic Compatibility — Testing and Measurement Techniques — Radiated Radio-frequency Electromagnetic Field Immunity Test;
— GB/T 17626.4-2018 Electromagnetic Compatibility — Testing and Measurement Techniques — Electrical Fast Transient/Burst Immunity Test;
— GB/T 17626.5-2008 Electromagetic Compatibility — Testing and Measurement Techniques — Surge (Impact) Immunity Test;
— GB/T 17626.6-2017 Electromagetic Compatibility — Testing and Measurement Techniques — Immunity to Conducted Disturbances, Induced by Radio-frequency Fields;
— GB/T 17626.7-2008 Electromagnetic Compatibility — Testing and Measurement Techniques — General Guide on Harmonics and Interharmonics Measurements and Instrumentation for Power Supply Systems and Equipment Connected Thereto;
— GB/T 17626.8-2006 Electromagetic Compatibility — Testing and Measurement Techniques — Power Frequency Magnetic Field Immunity Test;
— GB/T 17626.9-2011 Electromagnetic Compatibility — Testing and Measurement Techniques — Pulse Magnetic Field Immunity Test;
— GB/T 17626.10-2017 Electromagetic Compatibility — Testing and Measurement Techniques — Damped Oscillatory Magnetic Field Immunity Test;
— GB/T 17626.11-2008 Electromagnetic Compatibility — Testing and Measurement Techniques — Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests;
— GB/T 17626.12-2013 Electromagnetic Compatibility — Testing and Measurement Techniques — Ring Wave Immunity Tests;
— GB/T 17626.13-2006 Electromagnetic Compatibility — Testing and Measurement Techniques — Harmonics and Interharmonics Including Mains Signalling at A.C. Power Port, Low Frequency Immunity Test;
— GB/T 17626.14-2005 Electromagetic Compatibility — Testing and Measurement Techniques — Voltage Fluctuation Immunity Test;
— GB/T 17626.15-2011 Electromagetic Compatibility — Testing and Measurement Techniques — Specifications for Function and Design of Scintiloscope;
— GB/T 17626.16-2007 Electromagnetic Compatibility — Testing and Measurement Techniques — Test for Immunity to Conducted Common Mode Disturbances in the Frequency Range 0 Hz to 150 kHz;
— GB/T 17626.17-2005 Electromagetic Compatibility — Testing and Measurement Techniques — Ripple on D.C. Input Power Port Immunity Test;
— GB/T 17626.18-2016 Electromagetic Compatibility — Testing and Measurement Techniques — Damped Oscillatory Wave Immunity Test;
— GB/T 17626.20-2014 Electromagetic Compatibility — Testing and Measurement Techniques — Emission and Immunity Testing in Transverse Electromagnetic (TEM) Waveguide;
— GB/T 17626.21-2014 Electromagnetic Compatibility — Testing and Measurement Techniques — Reverberation Chamber Test Methods;
— GB/T 17626.22-2017 Electromagnetic Compatibility (EMC) — Testing and Measurement Techniques — Radiated Emissions and Immunity Measurements in Fully Anechoic Rooms (FARs);
— GB/T 17626.24-2012 Electromagnetic Compatibility — Testing and Measurement Techniques — Test Methods for Protective Devices for HEMP Conducted Disturbance;
— GB/T 17626.27-2006 Electromagetic Compatibility — Testing and Measurement Techniques — Unbalance Immunity Test;
— GB/T 17626.28-2006 Electromagetic Compatibility — Testing and Measurement Techniques — Variation of Power Frequency Immunity Test;
— GB/T 17626.29-2006 Electromagetic Compatibility — Testing and Measurement Techniques — Voltage Dips, Short Interruptions and Voltage Variations on D.C. Input Power Port Immunity Tests;
— GB/T 17626.30-2012 Electromagnetic Compatibility — Testing and Measurement Techniques — Power Quality Measurement Methods;
— GB/T 17626.34-2012 Electromagnetic Compatibility — Testing and Measurement Techniques — Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests for Equipment with Mains Current More Than 16 A per Phase.
This part is Part 4 of GB/T 17626.
This part is drafted in accordance with the rules given in the GB/T 1.1-2009.
This part replaces GB/T 17626.4-2008 Electromagnetic Compatibility — Testing and Measurement Techniques — Electrical Fast Transient/Burstimmunity in whole. The following technical changes have been made with respect to GB/T 17626.4-2008 (the previous edition):
— removal of IEC 60050-300:2001 International Electrotechnical Vocabulary — Electrical and Electronic Measurements and Measuring Instruments; Part 311: General Terms Relating to Measurements; Part 312: General Terms Relating to Electrical Measurements; Part 313: Types of Electrical Measuring Instruments; Part 314: Specific Terms according to the Type of Instrument (see Clause 2);
— addition of a term and its definition (see 3.1.1);
— addition of abbreviations (see 3.2);
— removal of the major elements of the test generator (see 6.2.1);
— addition of Figure 3 and the calculation formula of the ideal waveform (see 6.2.2);
— removal of "Figure 3 Waveshape of a Single Pulse into a 50 Ω Load", and addition of "Figure 3 Ideal Waveshape of a Single Pulse into a 50 Ω Load" (see 6.2.2, Figure 3);
— addition of 6.4.2 Calibration of the capacitive coupling clamp, and addition of Figures 7 and 8 (see 6.4.2);
— addition of 7.2.2 Verification of the test instrumentation (see 7.2.2);
— addition of label after capacitive coupling clamp in Figure 11 (see Figure 11);
— modification of the test setup for equipment with top entry, and addition of Figure 13 (see 7.2.2, Figure 13);
— removal of Figure 12 and addition of Figure 15 (see 7.4.2, Figure 15);
— addition of Annex C Measurement Uncertainty (MU) Considerations (see Annex C);
— removal of 1 in the Unit column of Tables C.1 and C.2 in Annex C (see Annex C, Tables C.1 and C.2);
— modification of A in Table C.1 of Annex C into α, because of there is no A in Annex C (see Annex C, Table C.1).
This part is identical with international standard IEC 61000-4-4:2012 Electromagnetic Compatibility (EMC) — Part 4-4: Testing and Measurement Techniques — Electrical Fast Transient/Burstimmunity Test.
For the purposes of this part, the following editorial changes have also been made:
— In order to be consistent with the existing standard series, the name of this part is changed to Electromagnetic Compatibility — Testing and Measurement Techniques — Electrical Fast Transient/Burstimmunity Test.
This part was proposed by and is under the jurisdiction of the National Technical Committee 246 on Electromagnetic Compatibility of Standardization Administration of China (SAC/TC 246).
The previous editions of this part are as follows:
GB/T 17626.4-1998, GB/T 17626.4-2008.
Electromagnetic Compatibility — Testing and Measurement Techniques — Electrical Fast Transient/Burstimmunity Test
1 Scope
This part of GB/T 17626 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures.
The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon.
Note: As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria. SAC/TC 246 and its subcommittees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products.
This part specifies:
— test voltage waveform;
— range of test levels;
— test equipment;
— calibration and verification procedures of test equipment;
— test setups;
— test procedure.
This part gives specifications for laboratory and in situ tests.
2 Normative References
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
GB/T 4365-2003 Electrotechnical Terminology — Electromagnetic Compatibility (IEC 60050(161):1990, IDT)
3 Terms, Definitions and Abbreviations
3.1 Terms and Definitions
For the purposes of this document, the terms and definitions of GB/T 4365-2003, as well as the following apply.
3.1.1
auxiliary equipment; AE
equipment necessary to provide the equipment under test (EUT) with the signals required for normal operation and equipment to verify the performance of the EUT
3.1.2
burst
sequence of a limited number of distinct pulses or an oscillation of limited duration
[GB/T 4365-2003, Definition 2.2]
3.1.3
calibration
set of operations which establishes, by reference to standards, the relationship which exists, under specified conditions, between an indication and a result of a measurement
Note 1: This term is based on the "uncertainty" approach.
Note 2: The relationship between the indications and the results of measurement can be expressed, in principle, by a calibration diagram.
[GB/T 2900.77-2008, Definition 311-01-09]
3.1.4
coupling
interaction between circuits, transferring energy from one circuit to another
3.1.5
common mode (coupling)
simultaneous coupling to all lines versus the ground reference plane
3.1.6
coupling clamp
device of defined dimensions and characteristics for common mode coupling of the disturbance signal to the circuit under test without any galvanic connection to it
3.1.7
coupling network
electrical circuit for the purpose of transferring energy from one circuit to another
3.1.8
decoupling network
electrical circuit for the purpose of preventing EFT voltage applied to the EUT from affecting other devices, equipment or systems which are not under test
3.1.9
degradation (of performance)
undesired departure in the operational performance of any device, equipment or system from its intended performance
Note 1 The term "degradation" can apply to temporary or permanent failure.
[GB/T 4365-2003, Definition 2.1]
3.1.10
EFT/B electrical fast transient/burst
electrical fast transient/burst
3.1.11
electromagnetic compatibility; EMC
ability of an equipment or system to function satisfactorily in its electromagnetic environment without introducing intolerable electromagnetic disturbances to anything in that environment
[GB/T 4365-2003, Definition 2.1]
3.1.12
EUT equipment under test
equipment under test
3.1.13
ground reference plane; GRP
flat conductive surface whose potential is used as a common reference [GB/T 4365-2003, Definition 2.4]
3.1.14
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an electromagnetic disturbance
[GB/T 4365-2003, Definition 2.1]
3.1.15
port
particular interface of the EUT with the external electromagnetic environment
3.1.16
pulse width
interval of time between the first and last instants at which the instantaneous value reaches 50% value of the rising and falling edge of the pulse
Note: IEC 60050(702):2001, Definition 702-03-04, modified.
3.1.17
rise time
interval of time between the instants at which the instantaneous value of a pulse first reaches 10% value and then the 90% value
[GB/T 4365-2003, Definition 2.2]
3.1.18
transient
pertaining to or designating a phenomenon or a quantity which varies between two consecutive steady states during a time interval which is short compared with the time-scale of interest
[GB/T 4365-2003, Definition 2.2]
3.1.19
unsymmetric mode (coupling)
single line coupling versus the ground reference plane
3.1.20
verification
set of operations which is used to check the test equipment system (e.g. the test generator and the interconnecting cables) and to gain confidence that the test system is functioning within the specifications given in Clause 6
Note 1: The methods used for verification may be different from those used for calibration.
Note 2: For the purposes of this basic EMC standard this definition is different from the definition given in IEV 311-01-13.
3.2 Abbreviations
AE Auxiliary Equipment
CDN Coupling/Decoupling Network
EFT/B Electrical Fast Transient/Burst
EMC ElectroMagnetic Compatibility
ESD ElectroStatic Discharge
EUT Equipment Under Test
GRP Ground Reference Plane
MU Measurement Uncertainty
PE Protective Earth
TnL Terminator non Linearity
4 General
The repetitive fast transient test is a test with bursts consisting of a number of fast transients, coupled into power, control, signal and earth ports of electrical and electronic equipment. Significant for the test are the high amplitude, the short rise time, the high repetition frequency, and the low energy of the transients.
The test is intended to demonstrate the immunity of electrical and electronic equipment when subjected to types of transient disturbances such as those originating from switching transients (interruption of inductive loads, relay contact bounce, etc.).
5 Test Levels
The preferred test levels for the electrical fast transient test, applicable to power, control, signal and earth ports of the equipment are given in Table 1.
Table 1 Test Levels
Open circuit output test voltage and repetition frequency of the impulses
Level Power ports, earth port (PE) Signal and control ports
Voltage peak
kV Repetition frequency
kHz Voltage peak
kV Repetition frequency
kHz
1 0.5 5 or 100 0.25 5 or 100
2 1 5 or 100 0.5 5 or 100
3 2 5 or 100 1 5 or 100
4 4 5 or 100 2 5 or 100
X a Special Special Special Special
The use of 5 kHz repetition frequency is traditional, however, 100 kHz is closer to reality. Product committees should determine which frequencies are relevant for specific products or product types.
With some products, there may be no clear distinction between power ports and signal ports, in which case it is up to product committees to make this determination for test purposes.
a "X" can be any level, above, below or in between the others. The level shall be specified in the dedicated equipment specification.
For selection of test levels, see Annex B.
6 Test Equipment
6.1 Overview
The calibration procedures of 6.2.3, 6.3.2 and 6.4.2 ensure the correct operation of the test generator, coupling/decoupling networks, and other items making up the test setup so that the intended waveform is delivered to the EUT.
6.2 Burst Generator
6.2.1 General
The simplified circuit diagram of the generator is given in Figure 1. The circuit elements Cc, Rs, Rm, and Cd are selected so that the generator delivers a fast transient under open circuit conditions and with a 50 Ω resistive load. The effective output impedance of the generator shall be 50 Ω.
Foreword II
1 Scope
2 Normative References
3 Terms, Definitions and Abbreviations
3.1 Terms and Definitions
3.2 Abbreviations
4 General
5 Test Levels
6 Test Equipment
6.1 Overview
6.2 Burst Generator
6.3 Coupling/Decoupling Network for a.c./d.c. Power Port
6.4 Capacitive Coupling Clamp
7 Test Setup
7.1 General
7.2 Test Equipment
7.3 Test Setup for Type Tests Performed in Laboratories
7.4 Test Setup for In-situ Tests
8 Test Procedure
8.1 General
8.2 Laboratory Reference Conditions
8.3 Execution of the Test
9 Evaluation of Test Results
10 Test Report
Annex A (Informative) Information on the Electrical Fast Transients
Annex B (Informative) Selection of the Test Levels
Annex C (Informative) Measurement Uncertainty (MU) Considerations
Bibliography
