标准编号:	NB/T 47013.11-2015/XG1-2018
中文名称:	承压设备无损检测 第11部分：X射线数字成像检测||含行业标准第1号修改单
英文名称:	Nondestructive Testing of Pressure Equipments Part 11: Standard practice for X-ray digital radiography, includes Amendment 1
中标分类:	H26    金属无损检验方法
行业分类:	NB    能源行业标准
ICS分类:	77.040.20 77.040.20    金属材料无损检测 77.040.20
发布机构:	国家能源局
发布日期:	2015-04-02
实施日期:	2018-7-1
标准状态:	valid
替代旧标准:	NB/T 47013.11-2015 承压设备无损检测 第11部分：X射线数字成像检测
翻译语言:	英文
文件格式:	PDF
中文字符数:	24000 字
翻译价格(元):	1450.0
交付时间:	付款后 1 个工作日

Notice of Amendment to the Professional Standard NB/T 47013.11-2015 Nondestructive Testing of Pressure Equipments Part 11: Standard Practice for X-ray Digital Radiography Amendment 1 This amendment was approved by No.7 Announcement by the National Energy Administration on May 14, 2018 and shall be implemented as of July 1, 2018. ○1 New provisions are added following "GB/T 23903 Resolution Indicators for Ray Image" in Clause 2: GB/T 26592 Non-destructive Testing Instruments - Properties Test Methods of Industrial X-ray Apparatus GB/T 26594 Non-destructive Testing Instruments - Properties Test Methods of Industrial X-ray Tube New provision is added following "NB/T 47013.2 Nondestructive Testing of Pressure Equipments - Part 2: Radiographic Testing": JB/T 11608 Non-destructive Testing Instruments Industrial X-ray Apparatus for Radiographic Testing ○2 In 4.1.1, the expression: "obtain radiation staff card" is changed to "obtain the corresponding certificate in accordance with the requirements of relevant laws and regulations". ○3 In 4.2, the expression: "Testing system" is changed to "Testing system and apparatus" ○4 New provision 4.2.1.3 is added following 4.2.1.2: The performance indexes of X-ray machine adopted shall meet the requirements of JB/T 11608. See GB/T 26594 and GB/T 26592 for the testing conditions and testing methods for the service performance. ○5 4.2.2.4 is replaced by the following new provision: Bad pixel requirements: In the 3×3 pixel area of the area array detector, the number of adjacent bad pixels shall not exceed 3; the number of the bad pixels in a line (column) shall not exceed 3, and those bad pixels shall not be located within 200 pixels from the center; the number of bad pixels in the imaging area shall not exceed 1% of the total pixels. In a linear array detector, the number of adjacent bad pixels shall not exceed 2. The detector system supplier shall provide the bad pixel list and bad pixel correction method upon delivery. ○6 New provisions 4.2.2.6 and 4.2.2.7 are added following 4.2.2.5: "4.2.2.6 The testing conditions and testing methods for performance indexes of the detector system, such as bad pixels, contrast sensitivity, resolution ratio, signal noise ratio, linear range, thickness tolerance , residual image, etc., shall be in accordance with those specified in the corresponding national or professional standards." "4.2.2.7 The quality certificate of the detector system shall include at least the technical parameters such as detector type, conversion screen parameters (if any), pixel size, imaging area, applicable range of ray energy, quantum conversion efficiency, fill factor, acquired frame rate, etc." ○7 In 4.2.4.6, the expression "according to assessment result" is changed to "automatically". ○8 4.2.6 is replaced by the following new provision: 4.2.6 Image quality indicator 4.2.6.1 For the purpose of this part, the image quality indicator includes wire-type image quality indicator and duplex wire-type image quality indicators. 4.2.6.2 The model and specification of the wire-type image quality indicator shall meet the requirements of GB/T 23901.1, while those of the duplex wire-type image quality indicators shall meet the requirements of GB/T 23901.5. ○9 New provisions 4.2.7 and 4.2.8 are added following 4.2.6: “4.2.7 Service performance of the testing system Appropriate testing equipment and apparatus shall be selected according to the performance indexes of each part of the testing system, together with the requirements of the to-be-tested workpiece and this part. The testing certificate certifying the conformity to the performance indexes of the above-mentioned equipment and apparatus and system software functions shall also be provided. The service performance of the testing system shall meet the image quality requirements of this part.” “4.2.8 Calibration or operation verification 4.2.8.1 The bad pixels, linear range, signal noise ratio, thickness tolerance, residual image and other performance indexes of the detector system shall be calibrated at least once a year and recorded. 4.2.8.2 The in-service exposure curve shall be verified at least once a year. The exposure curve shall be replotted in the case any important component of the X-ray machine is replaced or repaired. 4.2.8.3 Bad pixels of the detector are checked at least once every 3 months, and recorded and corrected accordingly. 4.2.8.4 Under one of the following circumstances, the system resolution ratio shall be verified in accordance with the method given in Annex A and recorded. a) alternation in the testing system; b) under normal service conditions, verification shall be carried out at least once every 3 months; c) reuse of the system after shutdown for 1 month. ○10 New provision 5.4.1.3 is added following 5.4.1.2: “If radiography fails to carried out for several times at the angular interval as specified in 5.4.1.1 or 5.4.1.2 due to structural reasons, upon agreement between the contract parties, angular interval specified in 5.4.1.1 or 5.4.1.2 may not be restricted compulsively, but effective measures shall be taken to extend the detectable range of defects as much as possible, and meanwhile signal noise ratio, sensitivity and resolution ratio within the image evaluation scope shall be guaranteed to meet the requirements, and relevant circumstances shall be explained in the testing report.” ○11 5.4.2 is replaced by the following new provision: 5.4.2 "The number of radiography for circumferential welded joints of small-diameter tubes not subjected to 100% testing shall be agreed by contract parties, and relevant records shall be kept.” ○12 "The model and specification of wire-type image quality indicator shall meet the requirements of GB/T 23901.1" in 6.1.1.3 is deleted. ○13 "The model and specification of duplex wire-type image quality indicator shall meet the requirements of GB/T 23901.5" in 6.1.1.4 is deleted. ○14 In 6.1.2.1.2, the expression: "During double-wall single-image radiography" is changed to "During double-wall single-image or double-wall double-image radiography” ○15 6.1.3.1 is replaced by the following new provision: "The duplex wire-type image quality indicator shall be arranged beside the X-ray machine. When the double-wall single-image radiography mode is adopted, the indicator may be arranged beside the detector." ○16 In 6.1.3.2.1, the expression "in the 1/4 position in the length of the tested" is changed to "adjacent to the weld under test". ○17 "For the double-wall double-image radiography mode of small-diameter tube, the penetrated thickness shall be the tube diameter.” is added at the end of 6.1.4.2. ○18 The following is added at the end of 6.1.4.3: "Note: in case of testing crack-sensitive materials or high-strength materials with the lower limit of standard tensile strength Rm ≥ 540MPa, compensation shall not be adopted." ○19 In 6.2.5.2, the expression "radiography specification"” is changed to "radiography parameter". ○20 The following is added at the end of A.5.1 a): "In the case of limited conditions, F may be appropriately reduced, but it shall be ensured that the geometric unsharpness of the testing system is not more than 5% of the pixel size of the detector." ○21 New provision A.6 is added following A.5.2: "The system resolution ratio shall meet the requirements of Tables 4 or 5. Where it is used for testing of double-wall double-image radiography mode for small-diameter tubes, the penetrated thickness in the Table shall be twice the wall thickness of the tube." ○22 In the fifth line of D.1, the expression "P - the pixel size of detector, μm;" is changed to "P - resolution, μm; Note: for the measurement of the normalized signal noise ratio of the system, P represents the system resolution; while for the measurement of the normalized signal noise ratio of the image, it represents the image resolution." ○23 D.2 is replaced by the following new provision: "The measurement of signal noise ratio: take a rectangular area of not less than 20 pixel ×50 pixel in the homogeneous area (for signal noise ratio of an image, it refers to the heat-affected zone or the base material and non-defective zone around the weld), calculate the average and standard deviation of this area, then obtain the measured signal noise ratio SNRm according to the definition of the signal noise ratio."

Foreword I 1 Scope 2 Normative References 3 Terms and Definitions 4 General Requirements 5 Testing Method 6 Image Quality and Assessment 7 Testing Result Assessment and Quality Grading (Acceptance) 8 Image Preservation and Storage 9 Testing Record and Report Appendix A (Normative) Checking Method of System Resolution Ratio Appendix B (Informative) Typical Radiography Mode Appendix C (Normative) Identification of Duplex Wire Type Image Quality Indicators Appendix D (Normative) Test Method for Normalized Signal to Noise Ratio Appendix E (Informative) Testing Report Format

行业标准修改通知单 NB/T 47013.11-2015 《承压设备无损检测 第11部分：X射线数字成像检测》 第1号修改单 本修改单经国家能源局于2018年5月14日以第7号公告批准，自2018年7月1日起实施。 ① 第2章“GB/T 23903 射线图像分辨力测试计”后补充新条文： “GB/T 26592 无损检测仪器 工业X射线探伤机性能测试方法 GB/T 26594 无损检测仪器 工业用X射线管性能测试方法” 第2章“NB/T47013.2 承压设备无损检测 第2部分：射线检测”后补充新条文： “JB/T 11608 无损检测仪器 工业用X射线探伤装置” ② 4.1.1条中更改用语： “并取得《放射工作人员证》”更改为“并按照有关法规的要求取得相应证书”。 ③ 4.2条中更改用语： “检测系统”更改为“检测系统与器材”。 ④ 4.2.1.2条后补充新条文，4.2.1.3 ： “采用的X射线机，其性能指标应满足JB/T11608的规定，使用性能测试条件及测试方法参考GB/T26594 和GB/T26592的规定。” ⑤ 4.2.2.4 条改用新条文： 4.2.2.4“坏像素要求：面阵列探测器3×3像素区域中，相邻坏像素不得超过3个；成行（成列）坏像素不得超过3个，且不得位于距离中心位置200像素以内；成像区域内坏像素不超过总像素的1%。线阵列探测器中，相邻的坏像素不允许超过2个。探测器系统供应商应提供出厂坏像素表和坏像素校正方法。” ⑥ 在4.2.2.5后补充新条文，4.2.2.6和4.2.2.7： “4.2.2.6探测器系统性能指标如：坏像素、对比灵敏度、分辨率、信噪比、线性范围、厚度宽容度、残影等，其测试条件及测试方法按相应国家或行业标准的规定执行。” “4.2.2.7探测器系统质量合格证中至少应给出探测器类型、转换屏参数（如有）、像素尺寸、成像面积、射线能量适用范围、量子转换效率、填充因子、采集帧频等技术参数。” ⑦ 4.2.4.6条中更改用语： “根据评定结果”更改为“自动”。 ⑧ 4.2.6条改用新条文： 4.2.6 “像质计 4.2.6.1本部分采用的像质计包括线型像质计和双线型像质计。 4.2.6.2线型像质计的型号和规格应符合GB/T 23901.1的规定，双线型像质计的型号和规格应符合GB/T 23901.5的规定。” ⑨ 4.2.6条后补充新条文，4.2.7、4.2.8： “4.2.7检测系统使用性能 应结合被检工件和本部分要求，根据检测系统各部分性能指标选择合适的检测设备和器材，并提供满足上述设备和器材性能指标及系统软件功能的测试证明文件。检测系统的使用性能应满足本部分规定的图像质量要求。” “4.2.8校准或运行核查 4.2.8.1 每年至少对探测器系统性能中的坏像素、线性范围、信噪比、厚度宽容度、残影等进行1次校准并记录。 4.2.8.2 每年至少应对使用中的曝光曲线进行1次核查。当射线机重要部件更换或经过修理后，应重新制作曝光曲线。 4.2.8.3 每3个月至少对探测器坏像素进行1次核查，并记录和校正。 4.2.8.4 存在如下情况应进行系统分辨率核查并记录，核查方法按附录A执行。 a）检测系统有改变时； b）正常使用条件下，每3个月应至少核查一次； c）在系统停止使用一个月后重新使用时。” ⑩ 5.4.1.2条后补充新条文，5.4.1.3： “由于结构原因不能按照5.4.1.1或5.4.1.2规定的间隔角度进行多次透照时，经合同双方商定，可不再强制限制5.4.1.1或5.4.1.2规定的间隔角度，但应采取有效措施尽量扩大缺陷可检出范围，并保证图像评定范围内信噪比、灵敏度和分辨率满足要求，并在检测报告中对有关情况进行说明。” ○11 5.4.2条改用新条文： 5.4.2“不要求100%检测的小径管环向焊接接头的透照次数由合同双方商定，并保存相关记录。 ○12 将6.1.1.3条中的“线型像质计的型号和规格应符合GB/T 23901.1的规定”删除。 ○13 将6.1.1.4条中的“双线型像质计的型号和规格应符合GB/T 23901.5的规定”删除。 ○14 6.1.2.1.2条中更改用语： “双壁单影透照时”更改为“双壁单影或双壁双影透照时” ○15 6.1.3.1条改用新条文： 6.1.3.1“双线型像质计应放在射线机侧。当采用双壁单影透照方式时，可放在探测器侧。” ○16 6.1.3.2.1条中更改用语： “被检测区长度的1/4左右位置”更改为“靠近被检焊缝”。 ○17 在6.1.4.2条句尾补充“对于小径管双壁双影透照方式，透照厚度应取管子直径。” ○18 在6.1.4.3条句尾补充: “注：对于使用裂纹敏感性材料或标准抗拉强度下限值Rｍ≥540MPa高强度材料进行检测时，不得采取补偿。” ○19 6.2.5.2条第一行中更改用语： “透照规格”更改为“透照参数”。 ○20 在A.5.1 a）条句尾补充： “在条件受限情况下，可适当减小F，但应保证检测系统的几何不清晰度不大于探测器像素尺寸的5%。” ○21 在A.5.2后补充新条文，A.6： “系统分辨率应满足表4或表5的要求，用于小径管双壁双影透照方式检测时，表中透照厚度应取2倍管子壁厚。” ○22 D.1中第5行中更改用语： “P—探测器像素大小（μm）”更改为：“P—分辨力（μm）； 注：测量系统归一化信噪比时，P为系统分辨力；测量图像归一化信噪比时，P为图像分辨力”。 ○23 D.2条改用新条文： D.2“信噪比测量是指在均匀区域（图像信噪比指热影响区或焊缝附近的母材、无缺陷处），取面积不小于20像素×55像素的矩形区，计算此区域的均值和标准差，按照信噪比定义得到测量信噪比SNRm。”