1 Scope
This standard specifies the technical requirements, inspection methods, inspection rules, and marking and packaging of magnetic particle flaw detectors (hereinafter referred to as "flaw detectors").
This standard is applicable to alternating current, direct current, half-wave rectified and full-wave rectified flaw detectors, but is not applicable to the yoke type magnetic particle flaw detectors.
2 Normative References
The following standards contain provisions which, through reference in this text, constitute provisions of this standard. For dated references, subsequent amendments to (excluding corrections to) or revisions of, any of these publications do not apply. However, parties to agreements based on this standard are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. For undated references, the latest edition of the normative document referred to applies.
GB/T 2611-2007 General Requirements for Testing Machines
GB/T 5097-2005 Non-destructive Testing - Penetrant Testing and Magnetic Particle Testing - Viewing Conditions (ISO 3509:2001, IDT)
GB/T 19001 Quality Management Systems - Requirements (GB/T 19001-2008, ISO 9001:2008, IDT)
GB/T 12604.5-2008 Non-destructive Testing - Terminology - Terms Used in Magnetic Particle Testing
JB/T 6147-2007 Requirements for the Packaging, Packaging Marking and Handling of Testing Machine Products
JB/T 7406.2-1994 Testing Machine Terminology - Non-destructive Test Instrument
3 Terminologies and Definitions
For the purposes of this standard, the terminologies and definitions established in GB/T 12604.5 and JB/T 7406.2 apply.
4 Technical Requirements
4.1 Environmental and Operating Conditions
Foreword III
1 Scope
2 Normative References
3 Terminologies and Definitions
4 Technical Requirements
4.1 Environmental and Operating Conditions
4.2 Type and Specification
4.3 Magnetizing System
4.4 Holding Device
4.5 Magnetic Ink Transfer System
4.6 Lighting Device
4.7 Demagnetizing Device
4.8 Safety Requirements
4.9 Transportation Bump Resistance Performance
4.10 Other Requirements
5 Quality Assurance
6 Inspection Methods
6.1 Inspection Conditions
6.2 Appliances Used for Inspection
6.3 Inspection on Rated Circumferential Magnetizing Current and Rated Longitudinal Magnetizing Ampere Turns
6.4 Inspection on Relative Errors of Indicated Values of Rated Circumferential Magnetizing Current and Rated Longitudinal Magnetizing Ampere Turns
6.5 Inspection on Bypass Current
6.6 Inspection on Tangential Magnetic Field Strength
6.7 Inspection on Safety Voltage of Circular Magnetizing Device and Longitudinal Magnetizing Device
6.8 Inspection on Remanence Induction Strength
6.9 Inspection on Illumination
6.10 Inspection on Temperature
6.11 Inspection on Continuity of Protective Grounding Circuit
6.12 Inspection on Insulation Resistance
6.13 Inspection on Dielectric Strength
6.14 Inspection on Transportation Bump Resistance Performance
6.15 Visual Inspection
7 Inspection Rules
7.1 End-of-manufacturing Inspection
7.2 Type Inspection
7.3 Judgment Rules
8 Marking and packaging
8.1 Marking
8.2 Packaging
Table 1 Basic Types and Specifications of Magnetic Particle Flaw Detectors
Table 2 Permissible Temperature of the Basic Parts of Magnetic Particle Flaw Detectors
Table 3 Specified Continuity Value of Protective Grounding Circuit
Table 4 Specified Value of Voltage for Dielectric Strength Test
