Methods for chemical analysis of laterite nickel ores―Part 23:Determination of cobalt,iron,nickel,phosphorus,aluminium oxide,calcium oxide,chromium oxide,magnesium oxide,manganese oxide,silicon dioxide and titanium dioxide content―Wavelength dispersive
Methods for chemical analysis of laterite nickel ores—
Part 23: Determination of cobalt, iron, nickel, phosphorus, aluminum oxide, calcium oxide, chromium oxide, magnesium oxide, manganese oxide, silicon dioxide and titanium dioxide content—
Wavelength dispersive X-ray fluorescence spectrometry
1 Scope
This part of YS/T 820 specifies the wavelength dispersive X-ray fluorescence spectrometry for the determination of cobalt, iron, nickel, phosphorus, aluminum oxide, calcium oxide, chromium oxide, magnesium oxide, manganese oxide, silicon dioxide and titanium dioxide in laterite nickel ores.
This part is applicable to the determination of cobalt, iron, nickel, phosphorus, aluminum oxide, calcium oxide, chromium oxide, magnesium oxide, manganese oxide, silicon dioxide and titanium dioxide content in laterite nickel ores. See Table 1 for the determination range.
Table 1 Determination range of each component in laterite nickel ores
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
GB/T 6379.2-2004 Accuracy (trueness and precision) of measurement methods and results—Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method (ISO 5725-2:1994, IDT)
GB/T 16597 Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods
YS/T 820.24-2012 Methods for chemical analysis of laterite nickel ores—Determination of hygroscopic moisture content—Gravimetric method
3 Method summary
The test material is melted and cast with flux to form a test material melting piece suitable for measurement by X-ray fluorescence spectrometer. Under the selected instrument measurement conditions, measure the X-ray fluorescence intensity of the characteristic spectral line of the element to be measured in the test material melting piece, calculate it according to the calibration curve or equation, and correct the interference effect between elements to obtain the content of the component to be measured in the sample.
4 Reagents and materials
Foreword i
1 Scope
2 Normative references
3 Method summary
4 Reagents and materials
5 Instruments and equipment
6 Specimen
7 Analytical procedures
8 Precision
9 Test report
Annex A (Informative) Preparation of calibration samples
Annex B (Informative) Reference working conditions for instruments
Annex C (Informative) Calibration equation